Wafer-stage adjustment for compensating for mismatches in temper

Amplifiers – With semiconductor amplifying device – Including temperature compensation means

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Details

330282, 330284, 330307, H03F 130

Patent

active

056636849

ABSTRACT:
An integrated circuit has at least two components described in the form of two ideally matched transistors, each of which operate interdependently as a function of temperature and at least one physical parameter associated with each of said components when implemented in integrated form. The circuit further includes compensation means, disposed in the integrated circuit, for generating and applying a bipolar compensation signal to at least one of said components so that said two components interdependently operate predictably, consistently and independently of temperature variations and differences between the physical parameter of said two components. The bipolar current is necessary so that both the level and polarity of the compensation signal can be appropriately adjusted during the manufacture of the integrated circuit as a wafer so as to eliminate the need to compensate for any mismatches in the two components following such manufacture.

REFERENCES:
patent: 3714462 (1973-01-01), Blackmer
patent: 4155047 (1979-05-01), Rubens et al.
patent: 4225794 (1980-09-01), Buff
patent: 4234804 (1980-11-01), Bergstrom
patent: 4331931 (1982-05-01), Adams
patent: 4341962 (1982-07-01), Buff
patent: 4403199 (1983-09-01), Blackmer
patent: 4454433 (1984-06-01), Welland
patent: 4560947 (1985-12-01), Frey
patent: 4791385 (1988-12-01), Wermuth
patent: 4823093 (1989-04-01), Frey
patent: 5157350 (1992-10-01), Rubens
de Haan et al. "A New Concept for Electronic Thermometers With an Intrinsic Reference", Conference: From Electronics to Microelectronics, Fourth European Conference on Electrotechnics-Eurocon '80, Stuttgart, Germany, 24-28 Mar. 1980 pp. 660-662.

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