Wafer-scale semiconductor device having fail-safe circuit

Details Wafer-scale semiconductor device having fail-safe circuit Wafer-scale semiconductor device having fail-safe circuit

1990-09-13

1992-05-05

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307443, 307219, 3072021, 3072964, 3072966, 307303, 3073031, H01J 1982, H03K 301

Patent

active

051110733

ABSTRACT:
A wafer-scale semiconductor memory device includes a wafer, and a plurality of memory chips formed on the wafer. The memory chips contain a memory chip which includes a storage circuit, and a switching transistor which selectively connects the storage circuit to a power supply line in response to a control signal. The memory chip also includes a control logic circuit which writes data into the storage circuit and reads out data from the storage circuit and which generates a logic signal used for controlling the transistor. Further, the memory chip includes a fail-safe circuit having a circuit element having a status showing whether or not the control logic circuit is malfunctioning. The fail-safe circuit generates the control signal from the logic signal and the status of the circuit element so that when the circuit element has the status showing that the control logic circuit is malfunctioning, the fail-safe circuit outputs the control signal which instructs the switching element to disconnect the storage circuit from the power supply line irrespective of the logic signal.

REFERENCES:
patent: 4669066 (1987-05-01), Kagawa et al.
patent: 4855613 (1989-08-01), Yamada et al.
patent: 4858196 (1989-08-01), Hein

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