Wafer processing method

Abrading – Precision device or process - or with condition responsive... – With feeding of tool or work holder

Reexamination Certificate

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Details

C451S063000, C451S041000, C451S057000, C257SE21237, C438S692000, C438S959000

Reexamination Certificate

active

08029335

ABSTRACT:
In a wafer processing method, rough grinding using a first grinding stone is divided into first and second steps. In the first step, a wafer is processed into a concave shape at a first transfer rate with a reinforcing rib area slightly left. Thereafter, as primary rough grinding in the second step, the grinding stone is positioned slightly on the inner circumferential side and the wafer is further processed into the concave portion at a second transfer rate faster than the first transfer rate. Since the first transfer rate is suppressed to a rate not to cause a burst chipping, a burst chipping resulting from the second step fast in the processing rate to ensure productivity will occur at the stepped edge portion on the inside of the reinforcing rib area surface. Thus, the flatness of the reinforcing rib area can be ensured.

REFERENCES:
patent: 6676491 (2004-01-01), Arai et al.
patent: 7527547 (2009-05-01), Kajiyama et al.
patent: 7559826 (2009-07-01), Sekiya
patent: 7622328 (2009-11-01), Masuda
patent: 7731567 (2010-06-01), Sekiya et al.
patent: 7758402 (2010-07-01), Yoshida et al.
patent: 2007/0020887 (2007-01-01), Sekiya
patent: 2007/0141955 (2007-06-01), Masuda
patent: A 2004-281551 (2004-10-01), None
patent: A 2005-123425 (2005-05-01), None
patent: A 2007-173487 (2007-07-01), None

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