Wafer processing method

Semiconductor device manufacturing: process – Semiconductor substrate dicing – By electromagnetic irradiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S460000

Reexamination Certificate

active

07915142

ABSTRACT:
A wafer processing method for dividing a wafer into individual devices along streets. The wafer processing method includes the steps of forming a division groove on the front side of the wafer along each street, attaching the front side of the wafer to the front side of a rigid plate having a plurality of grooves by using an adhesive resin, applying ultraviolet radiation to the adhesive resin to thereby increase the holding force of the adhesive resin, grinding the back side of the wafer to expose the division grooves to the back side of the wafer, attaching an adhesive tape to the back side of the wafer, immersing the wafer and the rigid plate in hot water to swell the adhesive resin, thereby decreasing the holding force of the adhesive resin, and removing the rigid plate from the front side of the wafer.

REFERENCES:
patent: 10-305420 (1998-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wafer processing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wafer processing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer processing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2709898

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.