Wafer probe

Details Wafer probe Wafer probe

2007-10-18

2008-11-25

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C029S827000

Reexamination Certificate

active

07456646

ABSTRACT:
The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

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