Wafer probe

Details Wafer probe Wafer probe

2007-06-19

2007-06-19

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S758010

Reexamination Certificate

active

09997501

ABSTRACT:
The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

REFERENCES:
patent: 491783 (1893-02-01), Moyer
patent: 2389668 (1945-11-01), Johnson
patent: 2545258 (1951-03-01), Cailloux
patent: 2762234 (1952-09-01), Dodd
patent: 2901696 (1959-08-01), Möllfors
patent: 2921276 (1960-01-01), Fubini
patent: 3218584 (1965-11-01), Ayer
patent: 3262593 (1966-07-01), Hainer
patent: 3396598 (1968-08-01), Grispo
patent: 3401126 (1968-09-01), Miller et al.
patent: 3609539 (1968-09-01), Gunthert
patent: 3429040 (1969-02-01), Miller
patent: 3445770 (1969-05-01), Harmon
patent: 3561280 (1971-02-01), MacPhee et al.
patent: 3573617 (1971-04-01), Randolph et al.
patent: 3596228 (1971-07-01), Reed et al.
patent: 3611199 (1971-10-01), Safran
patent: 3619780 (1971-11-01), Hocks
patent: 3622915 (1971-11-01), Davo
patent: 3634807 (1972-01-01), Grobe et al.
patent: 3648169 (1972-03-01), Wiesler
patent: 3654585 (1972-04-01), Wickersham
patent: 3622318 (1972-05-01), Decuyper
patent: 3680037 (1972-07-01), Nellis et al.
patent: 3686624 (1972-08-01), Napoli et al.
patent: 3700998 (1972-10-01), Lee et al.
patent: 3705379 (1972-12-01), Bogar
patent: 3725829 (1973-04-01), Brown
patent: 3740900 (1973-06-01), Youmans et al.
patent: 3766470 (1973-10-01), Hay et al.
patent: 3806801 (1974-04-01), Bove
patent: 3810016 (1974-05-01), Chayka et al.
patent: 3829076 (1974-08-01), Sofy
patent: 3833852 (1974-09-01), Schoch
patent: 3839672 (1974-10-01), Anderson
patent: 3849728 (1974-11-01), Evans
patent: 3862790 (1975-01-01), Davies et al.
patent: 3867698 (1975-02-01), Beltz et al.
patent: 3930809 (1976-01-01), Evans
patent: 3936743 (1976-02-01), Roch
patent: 3952156 (1976-04-01), Lahr
patent: 3971610 (1976-07-01), Buchoff et al.
patent: 3992073 (1976-11-01), Buchoff et al.
patent: 4001685 (1977-01-01), Roch
patent: 4008900 (1977-02-01), Khoshaba
patent: 4009456 (1977-02-01), Hopfer
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4035723 (1977-07-01), Kvaternik
patent: 4038599 (1977-07-01), Bove et al.
patent: 4038894 (1977-08-01), Knibbe et al.
patent: 4049252 (1977-09-01), Bell
patent: 4063195 (1977-12-01), Abrams et al.
patent: 4066943 (1978-01-01), Roch
patent: 4074201 (1978-02-01), Lennon
patent: 4116523 (1978-09-01), Coberly et al.
patent: 4123706 (1978-10-01), Roch
patent: 4124787 (1978-11-01), Aamoth et al.
patent: 4151465 (1979-04-01), Lenz
patent: 4161692 (1979-07-01), Tarzwell
patent: 4177421 (1979-12-01), Thornburg
patent: 4184133 (1980-01-01), Gehle
patent: 4184729 (1980-01-01), Parks et al.
patent: 4216467 (1980-08-01), Colston
patent: 4225819 (1980-09-01), Grau et al.
patent: 4232398 (1980-11-01), Gould et al.
patent: 4251772 (1981-02-01), Worsham et al.
patent: 4280112 (1981-07-01), Eisenhart
patent: 4284033 (1981-08-01), del Rio
patent: 4287473 (1981-09-01), Sawyer
patent: 4302146 (1981-11-01), Finlayson et al.
patent: 4306235 (1981-12-01), Christmann
patent: 4312117 (1982-01-01), Robillard et al.
patent: 4340860 (1982-07-01), Teeple, Jr.
patent: 4346355 (1982-08-01), Tsukii
patent: 4375631 (1983-03-01), Goldberg
patent: 4520314 (1985-05-01), Asch et al.
patent: 4541222 (1985-09-01), Joly
patent: 4563640 (1986-01-01), Hasegawa
patent: 4593243 (1986-06-01), Lao et al.
patent: 4641659 (1987-02-01), Sepponen
patent: 4646005 (1987-02-01), Ryan
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4652082 (1987-03-01), Warner
patent: 4663840 (1987-05-01), Ubbens et al.
patent: 4669805 (1987-06-01), Kosugi et al.
patent: 4673839 (1987-06-01), Veenendaal
patent: 4684883 (1987-08-01), Ackerman et al.
patent: 4684884 (1987-08-01), Soderlund
patent: 4685150 (1987-08-01), Maier
patent: 4696544 (1987-09-01), Costella
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4705447 (1987-11-01), Smith
patent: 4706050 (1987-11-01), Andrews
patent: 4707657 (1987-11-01), Boegh-Petersen
patent: 4714873 (1987-12-01), McPherson et al.
patent: 4727319 (1988-02-01), Shahriary
patent: 4727391 (1988-02-01), Tajima et al.
patent: 4727637 (1988-03-01), Buckwitz et al.
patent: 4734641 (1988-03-01), Byrd, Jr. et al.
patent: 4739259 (1988-04-01), Hadwin et al.
patent: 4740764 (1988-04-01), Gerlack
patent: 4746857 (1988-05-01), Sakai et al.
patent: 4749942 (1988-06-01), Sang et al.
patent: 4755742 (1988-07-01), Mallory et al.
patent: 4755872 (1988-07-01), Esrig et al.
patent: 4757255 (1988-07-01), Margozzi
patent: 4764723 (1988-08-01), Strid
patent: 4772846 (1988-09-01), Reeds
patent: 4780670 (1988-10-01), Cherry
patent: 4783625 (1988-11-01), Harry et al.
patent: 4788851 (1988-12-01), Brault
patent: 4791363 (1988-12-01), Logan
patent: 4793814 (1988-12-01), Zifcak et al.
patent: 4795962 (1989-01-01), Yanagawa et al.
patent: 4805627 (1989-02-01), Klingenbeck et al.
patent: 4810981 (1989-03-01), Herstein
patent: 4818059 (1989-04-01), Kakii et al.
patent: 4827211 (1989-05-01), Strid et al.
patent: 4835495 (1989-05-01), Simonutti
patent: 4837507 (1989-06-01), Hechtman
patent: 4849689 (1989-07-01), Gleason et al.
patent: 4853624 (1989-08-01), Rabjohn
patent: 4853627 (1989-08-01), Gleason et al.
patent: 4858160 (1989-08-01), Strid et al.
patent: 4864227 (1989-09-01), Sato
patent: 4871964 (1989-10-01), Boll et al.
patent: 4888550 (1989-12-01), Reid
patent: 4891584 (1990-01-01), Kamieniecki et al.
patent: 4893914 (1990-01-01), Hancock et al.
patent: 4894612 (1990-01-01), Drake et al.
patent: 4899126 (1990-02-01), Yamada
patent: 4899998 (1990-02-01), Teramachi
patent: 4901012 (1990-02-01), Gloanec et al.
patent: 4904933 (1990-02-01), Snyder et al.
patent: 4906920 (1990-03-01), Huff et al.
patent: 4908570 (1990-03-01), Gupta et al.
patent: 4912399 (1990-03-01), Greub et al.
patent: 4916002 (1990-04-01), Carver
patent: 4918373 (1990-04-01), Newberg
patent: 4918383 (1990-04-01), Huff et al.
patent: 4922186 (1990-05-01), Tsuchiya et al.
patent: 4922912 (1990-05-01), Watanabe
patent: 4926172 (1990-05-01), Gorsek
patent: 4970386 (1990-11-01), Buck
patent: 4972073 (1990-11-01), Lessing
patent: 4975638 (1990-12-01), Evans et al.
patent: 4980637 (1990-12-01), Huff et al.
patent: 4983910 (1991-01-01), Majidi-Ahy et al.
patent: 4987100 (1991-01-01), McBride et al.
patent: 4988062 (1991-01-01), London
patent: 4991290 (1991-02-01), MacKay
patent: 4998062 (1991-03-01), Ikeda
patent: 4998063 (1991-03-01), Miller
patent: 5001423 (1991-03-01), Abrami et al.
patent: 5003253 (1991-03-01), Majidi-Ahy et al.
patent: 5020219 (1991-06-01), Leedy
patent: 5021186 (1991-06-01), Ota et al.
patent: 5030907 (1991-07-01), Yih et al.
patent: 5045781 (1991-09-01), Gleason et al.
patent: 5059898 (1991-10-01), Barsotti et al.
patent: 5061192 (1991-10-01), Chapin et al.
patent: 5062628 (1991-11-01), Heyn et al.
patent: 5089774 (1992-02-01), Nakano
patent: 5091692 (1992-02-01), Ohno et al.
patent: 5097101 (1992-03-01), Trobough
patent: 5097207 (1992-03-01), Blanz
patent: 5101453 (1992-03-01), Rumbaugh
patent: 5116180 (1992-05-01), Fung et al.
patent: 5126286 (1992-06-01), Chance
patent: 5126696 (1992-06-01), Grote et al.
patent: 5133119 (1992-07-01), Afshari et al.
patent: 5134365 (1992-07-01), Okubo et al.
patent: 5136237 (1992-08-01), Smith et al.
patent: 5138289 (1992-08-01), McGrath
patent: 5145552 (1992-09-01), Yoshizawa et al.
patent: 5148131 (1992-09-01), Amboss et al.
patent: 5159264 (1992-10-01), Anderson
patent: 5159267 (1992-10-01), Anderson
patent: 5159752 (1992-11-01), Mahant-Shetti et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5172051 (1992-12-01), Zamborelli
patent: 5177438 (1993-01-01), Littlebury et al.
patent: 5180977 (1993-01-01), Huff
patent: 5202558 (1993-04-01), Barker
patent: 5202648 (1993-04-01), McCandless
patent: 5207585 (1993-05-01), Byrnes et al.
patent: 5225037 (1993-07-01), Elder et al.
patent: 5232789 (1993-08-01), Platz et al.
patent: 5233197 (1993-08-01), Bowman et al.
patent: 5266963 (1993-11-01), Carter
patent: 5267088 (1993-11-01), Nomura
patent: 5270664 (1993-12-01), McMurtry et al.
patent: 5274336 (1993-12-01), Crook et al.
patent: 5289117 (1994-02-01), Van Loan et al.
patent: 5293175 (1994-03-01), Hemmie et al.
patent: 5298972 (1994-03-01), Heffner
patent: 5313157 (1994-05-01),

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