Wafer probe

Details Wafer probe Wafer probe

1986-11-10

1988-08-16

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, 324 73PC, 333246, G01R 106, H01P 308

Patent

active

047647230

ABSTRACT:
A wafer probe for testing semiconductor devices brings low impedance connections closely adjacent device bonding pads for bypassing power supply voltages.

REFERENCES:
patent: 4184133 (1980-01-01), Gehle
patent: 4551747 (1985-11-01), Gilbert et al.
patent: 4553111 (1985-11-01), Barrow
patent: 4593243 (1986-06-01), Lao et al.
Bry et al., "By Pan Capacitor for Chip Probe"; IBM Technical Disclosure Bulletin; vol. 18, No. 11, 04/1976.

Affiliated with

Also associated with

Rating

Wafer probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wafer probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-602322