Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-02-20
2007-02-20
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C438S800000
Reexamination Certificate
active
10622050
ABSTRACT:
The invention, which relates to a wafer lifting device having a lifting platform arranged under a wafer receptacle, which lifting platform can be moved in the vertical direction and at least three pins which can be moved in through holes in the wafer receptacle. The pins are separately guided in the through holes. A pin is guided and held such that it can be moved longitudinally, and the pin guide is fixedly connected to the wafer receptacle.
REFERENCES:
patent: 5669977 (1997-09-01), Shufflebotham et al.
patent: 5848670 (1998-12-01), Salzman
patent: 6572708 (2003-06-01), Gujer et al.
patent: 6646857 (2003-11-01), Anderson et al.
patent: 274708 (1989-12-01), None
patent: 05-129421 (1993-05-01), None
patent: 05129421 (1993-05-01), None
patent: 0700702 (1995-01-01), None
patent: 07007072 (1995-01-01), None
Bednara Falk
Herberg Steffen
Hunger Rudiger
Baker & Botts L.L.P.
Infineon - Technologies AG
Nguyen Ha Tran
Nguyen Tung X.
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