Coherent light generators – Particular resonant cavity – Distributed feedback
Reexamination Certificate
2007-02-20
2007-02-20
Schillinger, Laura M. (Department: 2813)
Coherent light generators
Particular resonant cavity
Distributed feedback
C372S034000, C372S097000
Reexamination Certificate
active
10126348
ABSTRACT:
Wafer-level stage testing of semiconductor lasers can be facilitated by directing a light beam emitted from the semiconductor laser toward a direction different from a path of the light beam as originally emitted from the laser. A test structure can be coupled to a back facet of the laser and can include a first region separated from a second region by an inclined interface. When a light beam is emitted from the laser, the light beam can be received on the inclined interface and then directed toward a light detector for detection and evaluation.
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