Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate
2008-09-19
2010-12-14
Clark, Jasmine J (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified configuration
C257S693000, C257S704000, C257S347000, C257SE23067, C257SE23128
Reexamination Certificate
active
07851925
ABSTRACT:
A wafer-level packaged integrated circuit includes a semiconductor substrate including a first silicon layer. A micro-electromechanical system (MEMS) device is integrated into the first silicon layer. A thin-film deposited sealing member is deposited over the first silicon layer and is configured to seal a cavity in the first silicon layer. At least one additional layer is formed over the sealing member. At least one under bump metallization (UBM) is formed over the at least one additional layer.
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Loehndorf Markus
Schoen Florian
Theuss Horst
Clark Jasmine J
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
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