Wafer level burn-in tester

Details Wafer level burn-in tester Wafer level burn-in tester

1999-11-29

2000-06-20

Davis, Antoine Duval

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

1004

Patent

active

D04267850

REFERENCES:
patent: D333144 (1993-02-01), Kolzumi
patent: D352911 (1994-11-01), Yamamoto et al.
patent: D365584 (1995-12-01), Nakagone et al.
patent: 5851143 (1998-12-01), Hamid
patent: 5929651 (1993-02-01), Leas et al.

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