Semiconductor device manufacturing: process – Semiconductor substrate dicing – By electromagnetic irradiation
Reexamination Certificate
2006-03-21
2008-11-04
Evans, Geoffrey S (Department: 3742)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
By electromagnetic irradiation
Reexamination Certificate
active
07446022
ABSTRACT:
A wafer laser processing method for forming a groove in a wafer having a protective film on the processing surface of a substrate along a predetermined processing line, comprising a first step for forming a first groove in the protective film along the dividing lines by applying a first pulse laser beam set to an output at which the protective film can be processed but the substrate can not be processed, to the protective film along the processing lines; and a second step for forming a second groove in the substrate along the first grooves by applying a second pulse laser beam set to an output at which the substrate can be processed, along the first grooves.
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Kitahara Nobuyasu
Takeda Noboru
Yoshikawa Toshiyuki
Disco Corporation
Evans Geoffrey S
Smith , Gambrell & Russell, LLP
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