Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Reexamination Certificate
2011-03-08
2011-03-08
Young, Christopher G (Department: 1721)
Radiation imagery chemistry: process, composition, or product th
Including control feature responsive to a test or measurement
C430S311000, C430S322000, C355S053000, C355S067000, C355S070000, C355S077000, C356S399000, C356S401000
Reexamination Certificate
active
07901854
ABSTRACT:
A wafer edge exposure unit comprises a chuck for supporting a wafer. The chuck is rotatable about a central axis. A plurality of light sources are positioned or movably positionable with a common radial distance from the axis of the rotatable chuck, each light source configured to direct exposure light on a respective edge portion of the wafer simultaneously.
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Huang Po-Chang
Lee Heng-Jen
Liu Heng-Hsin
Duane Morris LLP
Koffs Steven E.
Taiwan Semiconductor Manufacturing Co. Ltd.
Young Christopher G
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