Wafer edge exposure unit

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement

Reexamination Certificate

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Details

C430S311000, C430S322000, C355S053000, C355S067000, C355S070000, C355S077000, C356S399000, C356S401000

Reexamination Certificate

active

07901854

ABSTRACT:
A wafer edge exposure unit comprises a chuck for supporting a wafer. The chuck is rotatable about a central axis. A plurality of light sources are positioned or movably positionable with a common radial distance from the axis of the rotatable chuck, each light source configured to direct exposure light on a respective edge portion of the wafer simultaneously.

REFERENCES:
patent: 5723385 (1998-03-01), Shen et al.
patent: 5966628 (1999-10-01), Wei et al.
patent: 6089763 (2000-07-01), Choi et al.
patent: 6114747 (2000-09-01), Wei et al.
patent: 6214441 (2001-04-01), Liu et al.
patent: 6743735 (2004-06-01), Chu et al.
patent: 6875971 (2005-04-01), Kim
patent: 7573054 (2009-08-01), Iwashita et al.
patent: 2004/0212809 (2004-10-01), Shim et al.
patent: 2006/0055910 (2006-03-01), Lee
patent: 2007/0009815 (2007-01-01), Oh et al.
patent: 2007/0085988 (2007-04-01), Kim

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