Electrolysis: processes – compositions used therein – and methods – Electrolytic material treatment – Removing metal
Patent
1998-06-04
2000-05-02
Phasge, Arun S.
Electrolysis: processes, compositions used therein, and methods
Electrolytic material treatment
Removing metal
205772, 205717, 205721, 205660, 205686, 204212, 204224M, C30B 3002
Patent
active
060568690
ABSTRACT:
A device for electrochemically deplating metal from side edges and a backside of a semiconductor wafer or substrate. The device includes a shaped cathode having a shape substantially corresponding to a shape of at least a portion of the semiconductor wafer, such that the shaped cathode at least partially covers the backside and at least partially covers the side edges of the semiconductor wafer. The position of at least one of the semiconductor wafer and the shaped cathode is altered by position altering apparatus during the electrochemical deplating.
REFERENCES:
patent: 4793895 (1988-12-01), Kaanta et al.
patent: 4821466 (1989-04-01), Kato et al.
patent: 4934102 (1990-06-01), Leach et al.
patent: 5078801 (1992-01-01), Malik
patent: 5096550 (1992-03-01), Mayer et al.
patent: 5183972 (1993-02-01), Duane et al.
patent: 5217586 (1993-06-01), Datta et al.
patent: 5219787 (1993-06-01), Carey et al.
patent: 5225034 (1993-07-01), Yu et al.
patent: 5240552 (1993-08-01), Yu et al.
patent: 5246885 (1993-09-01), Braren et al.
patent: 5256274 (1993-10-01), Poris
patent: 5262354 (1993-11-01), Cote et al.
patent: 5449313 (1995-09-01), Kordonsky et al.
patent: 5486234 (1996-01-01), Contolini et al.
patent: 5492594 (1996-02-01), Burke et al.
patent: 5534106 (1996-07-01), Cote et al.
patent: 5543032 (1996-08-01), Datta et al.
patent: 5567300 (1996-10-01), Datta et al.
patent: 5575706 (1996-11-01), Tsai et al.
patent: 5585673 (1996-12-01), Joshi et al.
International Business Machines - Corporation
Phasge Arun S,.
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