Wafer cleaning system

Cleaning and liquid contact with solids – Apparatus – With heating – cooling or heat exchange means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

134147, 134148, B08B 312

Patent

active

06039059&

ABSTRACT:
A wafer cleaning system cleans semiconductor wafers using megasonic energy to agitate cleaning fluid applied to the wafer. A source of acoustic energy vibrates an elongated quartz probe which transmits the acoustic energy into the fluid. One form of the probe has a solid cylindrical-shaped cleaning portion within the tank and a flared rear portion with an increasing diameter outside the tank. A heat transfer member acoustically coupled to the larger rear portion of the probe and to a transducer conducts heat away from the transducer. A housing for the heat transfer member and transducer supports those components and provides means for conducting coolant through the housing to control the temperature of the transducer. In one arrangement, fluid is sprayed onto both sides of a wafer while a probe is positioned close to an upper side. In another arrangement, a short probe is positioned with its end face close to the surface of a wafer, and the probe is moved over the wafer as it rotates. The probe may also be positioned through a central hole in a plurality of discs to clean a group of such elements at one time.

REFERENCES:
patent: 2498737 (1950-02-01), Holden
patent: 2699403 (1955-01-01), Courts
patent: 2713998 (1955-07-01), Eicken
patent: 2738173 (1956-03-01), Massa
patent: 2760501 (1956-08-01), Gander
patent: 2802476 (1957-08-01), Kearney
patent: 2814575 (1957-11-01), Lange, Jr.
patent: 2934661 (1960-04-01), Chambers
patent: 2950725 (1960-08-01), Jacke et al.
patent: 3077155 (1963-02-01), Maddock et al.
patent: 3114654 (1963-12-01), Nishiyama et al.
patent: 3373752 (1968-03-01), Inoue
patent: 3401708 (1968-09-01), Henes
patent: 3499792 (1970-03-01), Veith
patent: 3596883 (1971-08-01), Brech
patent: 3676963 (1972-07-01), Rice et al.
patent: 3694675 (1972-09-01), Loveday
patent: 3700937 (1972-10-01), Rissolo
patent: 3702519 (1972-11-01), Rice et al.
patent: 3845332 (1974-10-01), Last
patent: 3893869 (1975-07-01), Mayer et al.
patent: 3900162 (1975-08-01), Titus et al.
patent: 3972018 (1976-07-01), Erickson
patent: 4027686 (1977-06-01), Shortes et al.
patent: 4038786 (1977-08-01), Fong
patent: 4111546 (1978-09-01), Maret
patent: 4178188 (1979-12-01), Dussault et al.
patent: 4183011 (1980-01-01), Massa
patent: 4326553 (1982-04-01), Hall
patent: 4373944 (1983-02-01), Glick et al.
patent: 4389820 (1983-06-01), Fong et al.
patent: 4401131 (1983-08-01), Lawson
patent: 4402458 (1983-09-01), Lierke et al.
patent: 4461651 (1984-07-01), Hall
patent: 4489740 (1984-12-01), Rattan et al.
patent: 4537511 (1985-08-01), Frei
patent: 4543130 (1985-09-01), Shwartzman
patent: 4565942 (1986-01-01), Sakai et al.
patent: 4579000 (1986-04-01), Sudo
patent: 4591485 (1986-05-01), Olsen et al.
patent: 4631250 (1986-12-01), Hayashi
patent: 4635666 (1987-01-01), Daley et al.
patent: 4655847 (1987-04-01), Ichinoseki et al.
patent: 4691725 (1987-09-01), Parisi
patent: 4694527 (1987-09-01), Yoshizawa
patent: 4744181 (1988-05-01), Moore et al.
patent: 4747421 (1988-05-01), Hayashi
patent: 4804007 (1989-02-01), Bran
patent: 4806171 (1989-02-01), Whitlock et al.
patent: 4823041 (1989-04-01), Inoue et al.
patent: 4857113 (1989-08-01), Hodge
patent: 4863561 (1989-09-01), Freeman et al.
patent: 4869278 (1989-09-01), Bran
patent: 4902350 (1990-02-01), Steck
patent: 4917123 (1990-04-01), McConnell et al.
patent: 4932168 (1990-06-01), Tada et al.
patent: 4936922 (1990-06-01), Cherry
patent: 4971920 (1990-11-01), Miyashita et al.
patent: 4974375 (1990-12-01), Tada et al.
patent: 4978067 (1990-12-01), Berger et al.
patent: 4980300 (1990-12-01), Miyashita et al.
patent: 4997490 (1991-03-01), Vetter et al.
patent: 4998549 (1991-03-01), Bran
patent: 5001084 (1991-03-01), Kawai et al.
patent: 5013366 (1991-05-01), Jackson et al.
patent: 5017236 (1991-05-01), Moxness et al.
patent: 5018988 (1991-05-01), Kibblewhite et al.
patent: 5020200 (1991-06-01), Mimasaka et al.
patent: 5025597 (1991-06-01), Tada et al.
patent: 5035750 (1991-07-01), Tada et al.
patent: 5037481 (1991-08-01), Bran
patent: 5062898 (1991-11-01), McDermott et al.
patent: 5071776 (1991-12-01), Matsushita et al.
patent: 5090432 (1992-02-01), Bran
patent: 5119840 (1992-06-01), Shibata
patent: 5125979 (1992-06-01), Swain et al.
patent: 5129956 (1992-07-01), Pickering et al.
patent: 5147466 (1992-09-01), Ohmori et al.
patent: 5247954 (1993-09-01), Grant et al.
patent: 5259890 (1993-11-01), Goff
patent: 5279316 (1994-01-01), Miranda
patent: 5286657 (1994-02-01), Bran
patent: 5316591 (1994-05-01), Chao et al.
patent: 5364474 (1994-11-01), Williford, Jr.
patent: 5365960 (1994-11-01), Bran
patent: 5534076 (1996-07-01), Bran
patent: 5721463 (1998-02-01), Snyder
International Search Report for corresponding PCT Application No. PCT/US97/11812 dated Nov. 10, 1997.
"10 MHz Ultrasonic Silicon Cleaning Tool", IBM Technical Disclosure Bulletin, vol. 37, No. 6A, p. 585, Jun. 1, 1994.
Stuart A. Hoenig; Cleaning Surfaces With Dry Ice; Compressed Air Magazine; Aug. 1986; pp. 22-25.
Va-Tran Systems, Inc.; Sno Gun.TM. Dry Ice Snow Cleaning System for Electronic, Semi-Conductor, Medical, Optical and Other Diverse Industries.
CO.sub.2 Snow/Pellet Cleaning/Super Critical Fluid; Precision Cleaning; Dec. 1995; vol. III, No. 11, p. 48.
Robert Sherman; John Grob and Walter Whitlock; Dry Surface Cleaning Using CO.sub.2 Snow; Journal Of Vacuum Science & Technology B, Second Series, vol. 9, No. 4, Jul./Aug. 1991; pp. 1970-1977.
Wayne T. McDermott, Richard C. Ockovic, Jin Jwang Wu and Robert J. Miller; Removing Submicron Surface Particles Using A Cryogenic Argon-Aerosol Technique; Microcontamination; Oct. 1991; pp. 33-36 and 94-95.
Woodruff et al., Abstract, "Steam condensation on electroplated gold: effect of plating thickness", Intl Jnl Heat Mass Trans, vol. 22, pp. 629-632, 1979.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wafer cleaning system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wafer cleaning system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer cleaning system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-722430

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.