Wafer bonded MOS decoupling capacitor

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S393000, C438S250000, C438S239000

Reexamination Certificate

active

07064043

ABSTRACT:
A technique for forming a MOS capacitor (100) that can be utilized as a decoupling capacitor is disclosed. The MOS capacitor (100) is formed separately from the particular circuit device (170) that it is to service. As such, the capacitor (100) and its fabrication process can be optimized in terms of efficiency, etc. The capacitor (100) is fabricated with conductive contacts (162) that allow it to be fused to the device (170) via conductive pads (172) of the device (170). As such, the capacitor (100) and device (170) can be packaged together and valuable semiconductor real estate can be conserved as the capacitor (100) is not formed out of the same substrate as the device (170). The capacitor (100) further includes deep contacts (150, 152) whereon bond pads (180, 182) can be formed that allow electrical connection of the capacitor (100) and device (170) to the outside world.

REFERENCES:
patent: 5640049 (1997-06-01), Rostoker et al.
patent: 6222246 (2001-04-01), Mak et al.
patent: 6806568 (2004-10-01), Schaper
patent: 6838332 (2005-01-01), Sanchez et al.
patent: 2002/0094629 (2002-07-01), Belleville et al.
patent: 2004/0195694 (2004-10-01), Duncombe et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wafer bonded MOS decoupling capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wafer bonded MOS decoupling capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer bonded MOS decoupling capacitor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3660161

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.