Wafer-based planning methods and systems for batch-based...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Reexamination Certificate

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11288489

ABSTRACT:
Computer-implemented wafer-based planning methods for batch-based processing tools. Tool groups are appended in a tool group level of planning data provided by a MES for converting planning data from batch-based to wafer-based data. The planning data with appended tool group is applied to dispatch processing tools.

REFERENCES:
patent: 6687563 (2004-02-01), Wang et al.
patent: 7027885 (2006-04-01), Barto et al.
patent: 7043322 (2006-05-01), Denton et al.
patent: 2002/0116086 (2002-08-01), Huber et al.
patent: 2002/0160621 (2002-10-01), Joma et al.
patent: 2003/0120371 (2003-06-01), Joma et al.
patent: 2003/0225474 (2003-12-01), Mata et al.
patent: 2005/0113950 (2005-05-01), Brown
patent: 2005/0256599 (2005-11-01), Peng
patent: 2006/0074522 (2006-04-01), Liang et al.
patent: 2006/0265162 (2006-11-01), Muro et al.

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