Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2007-01-30
2007-01-30
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C438S463000, C438S464000
Reexamination Certificate
active
10082372
ABSTRACT:
A method for balancing layer-caused compressive or tensile stress in a semiconductor die, die wafer or similar substrate uses a stress-balancing layer (SBL) attached to the opposite side from the stress-causing layer before the die or wafer is significantly warped are provided. The SBL may also serve as, or support, an adhesive layer for die attach, and be of a markable material for an enhance marking method.
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Connell Michael E.
Jiang Tongbi
Lebentritt Michael
Micro)n Technology, Inc.
Stevenson Andre'C.
Trask & Britt
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