X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-04-11
2010-06-08
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Reexamination Certificate
active
07734012
ABSTRACT:
One aspect relates to capturing one or more tomographic-type Compton scattering based visualizations, images, or provided information of an at least some matter of at least a portion of an individual based at least partially on Compton scattering of an at least one X-ray being applied to the at least some matter of the at least the portion of the individual. Another aspect relates to deriving an at least one material characteristic distribution function that substantially fits at least some data obtained at least partially by scattering of an at least one applied X-ray within at least some matter of at least a portion of an individual to form at least one Compton scattered X-ray.
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Boyden Edward S.
Hyde Roderick A.
Ishikawa Muriel Y.
Jung Edward K. Y.
Leuthardt Eric C.
The Invention Science Fund I LLC
Thomas Courtney
LandOfFree
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