Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2011-03-29
2011-03-29
Young, Brian (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S155000
Reexamination Certificate
active
07916064
ABSTRACT:
A voltage-to-digital converting device includes a first voltage-to-time converter outputting a first delay clock having a first time delay relative to a reference clock in response to an input voltage, and a second voltage-to-time converter outputting a second delay clock having a second time delay relative to the reference clock in response to a feedback voltage. The first and second time delays correspond respectively to the input and feedback voltages. A time-to-digital converting circuit receives the first and second delay clocks from the first and second voltage-to-time converters, compares phases of the first and second delay clocks, generates the feedback voltage based on result of phase comparison made thereby, and outputs a digital signal upon detecting that the phases of the first and second delay clocks are in-phase.
REFERENCES:
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patent: 7446693 (2008-11-01), Perraud
Begueret, J.B, et al. “Converters Dedicated to Long-Term Monitoring of Strain Gauge Transducers.” IEEE JSSC, vol. 32, p. 349-356, Mar. 1997.
Bae, S.J. “A VCDL-based 60-760MHz Dual-Loop DLL With Infinited Phase-Shift Capability and Adaptive-Bandwidth Scheme.” IEEE JSSC, vol. 40, pp. 1119-1129. May 2005.
Chiu Wei-Hao
Lin Tsung-Hsien
Yang Chung-Hsing
Dickstein & Shapiro LLP
National Taiwan University
Young Brian
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