Voltage-stressing and testing of networks using moving probes

Details Voltage-stressing and testing of networks using moving probes Voltage-stressing and testing of networks using moving probes

1994-05-09

1995-08-01

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324519, 324677, 324711, 324718, G01R 3108, G01R 2702

Patent

active

054382726

ABSTRACT:
A network-under-test of a device is tested relative to other networks of the device by probing the network-under-test with a probe; generating a voltage which is applied across the network-under-test via the probe for developing a transient voltage between the network-under-test and the other networks of the device for stressing leakage resistance between the network-under-test and the other networks; and determining if the stressed leakage resistance is acceptable for determining integrity of the network-under-test relative to the other networks of the device.

REFERENCES:
patent: 3255409 (1966-06-01), Sztybel
patent: 3296523 (1967-01-01), Haas et al.
patent: 3417323 (1968-12-01), Willimson
patent: 4565966 (1986-01-01), Burr et al.
patent: 5006808 (1991-04-01), Watts
patent: 5266901 (1993-11-01), Woo

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