Voltage offset measurement for calibration of an integrated...

Details Voltage offset measurement for calibration of an integrated... Voltage offset measurement for calibration of an integrated...

2007-05-15

2007-05-15

Pascal, Robert (Department: 2817)

Amplifiers

With periodic switching input-output

Reexamination Certificate

active

11052104

ABSTRACT:
Voltage offset of an integrated circuit amplifier is accurately determined for calibration of the device. Circuit connections are established between the integrated circuit and an external device, such as an IC handler. Internal noise gain resistors formed within the integrated circuit are connected by internal switches to the amplifier and the output voltage is measured so that a value of a voltage offset of the amplifier while the noise gain resistors are connected can be calculated. The use of internal noise gain resistors produces a voltage offset component of the output voltage that is significantly greater in magnitude than effects of thermocouple voltages generated by circuit junction connections.

REFERENCES:
patent: 6426674 (2002-07-01), Davidescu
patent: 6459335 (2002-10-01), Darmawaskita et al.
George Erdi “A Precision Trim Technique for Monolithic Analog Circuits”IEEE Journal of Solid-State Circuits, vol. SC-10, No. 6 Dec. 1975.

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