Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-15
2011-03-15
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07908102
ABSTRACT:
A base of a pnp transistor Tr1is connected to an isolation device D1, an emitter thereof is connected to a cathode of a high voltage battery BH, and a collector thereof is connected to an anode of the high voltage battery BH. Npn transistors Tr21to Tr2nare provided respectively to blocks B1to Bn. Bases of the npn transistors Tr21to Tr2nare connected to the collector of the transistor Tr1, emitters thereof are connected to anodes of corresponding blocks B1to Bn, and collectors are connected to awakening terminals of high voltage measuring circuits11to1n.
REFERENCES:
patent: 2005/0038614 (2005-02-01), Botts et al.
patent: 2008/0222431 (2008-09-01), Paniagua et al.
patent: 2008/0307240 (2008-12-01), Dahan et al.
patent: 2000-88898 (2000-03-01), None
patent: 2006-042591 (2006-02-01), None
Matsuura Kimihiro
Sekizaki Masashi
Edwards Angell Palmer & & Dodge LLP
Raymond Edward
Yazaki -Corporation
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