Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-08-10
1996-08-13
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 96, G01R 3100
Patent
active
055460119
ABSTRACT:
An electro-optic material constituting an E-O probe has a refractive index for light from a semiconductor laser, which is changed in accordance with an electric field from a device to be measured. The electro-optic effect is substantially canceled upon incidence of light from an Ar.sup.+ laser. A mechanical chopper modulates the light emitted from the Ar.sup.+ laser and causes the light to be incident on the E-O probe. A lock-in amplifier detects the polarized state of the light reflected by the E-O probe synchronized with the modulation, thereby measuring the voltage of the device.
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Kolner et al, "Electrooptic Sampling in GaAs Integrated Circuits", IEEE Journal of Quantum Electronics, 1986, pp. 79-93 (unavailable month).
Valdmanis et al, "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. OE-22, No. 1, Jan. 1986, pp. 69-78.
Aoshima et al, "Non-Contact Picosecond Electro-Optic Sampling with a Semiconductor Laser", T. IEEE, Japan, vol. 111-C, No. 4, 1991, pp. 145-154.
Takahashi et al, "How the Electro-Optic Probing System can Contribute to LSI Testing?", IMTC94, May 10-12, Hamamatsu, pp. 1484-1491.
Aoshima Shinichiro
Takahashi Hironori
Hamamatsu Photonics K.K.
Nguyen Vinh P.
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