Voltage measurement system

Details Voltage measurement system Voltage measurement system

1995-09-28

1997-05-20

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Using radiant energy

G01R 3100

Patent

active

056315554

ABSTRACT:
An apparatus of this invention emits light onto an EO probe and detects the light reflected by the EO probe by using an MSM photodetector. The MSM photodetector is applied with a voltage of a frequency nf.sub.0 +.DELTA.f.

REFERENCES:
patent: 4446425 (1984-05-01), Valdmanis et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4996475 (1991-02-01), Takahashi et al.
patent: 5126661 (1992-06-01), Harvey et al.
Aoshima et al, "Non-Contact Picosecond Electro-Optic Sampling With a Semiconductor Laser", T. IEEE, Japan, vol. 111-C, No. 4, 1991, pp. 145-154 (month unavailable).
Takahashi et al, "How The Electro-Optic Probing System can Contribute to LSI Testing", IMTC '94, May 10-12, Hamamatsu, pp. 1484-1491.
Kolner et al, "Electrooptic Sampling in GaAs Integrated Circuits", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 79-93.
Valdmanis et al, "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.

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