Voltage mapping device having fast time resolution

Details Voltage mapping device having fast time resolution Voltage mapping device having fast time resolution

1988-07-12

1990-03-06

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 96, 324 731, G01R 3128

Patent

active

049069225

ABSTRACT:
A voltage detecting device for detecting voltages in an object under test including an electro-optic material covering a plurality of parts of the object under test; the refractive index of the electro-optic material being variable according to an applied voltage. A light source emits light through the electro-optic material toward the object under test and a detecting device receives an emergent light beam reflected from within the electro-optic material in order to detect voltages in the object. Further, a scanning device automatically scans the object under test with the light beam in order to detect voltages at a plurality of locations on the object.

REFERENCES:
patent: 3934199 (1976-01-01), Channin
patent: 4242635 (1980-12-01), Burns
patent: 4355278 (1982-10-01), Burns et al.
patent: 4446425 (1984-05-01), Valdmanis et al.
patent: 4588950 (1986-05-01), Henley
patent: 4603283 (1986-07-01), Mourou et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4761607 (1988-08-01), Shiragasawa et al.
Tsuchiya, Advances in Streak Camera Instrumentation for the Study of Biological and Physical Processes, IEEE Journal of Quantum Electronics, vol. QE-20, No. 12, Dec. 1984, pp. 1515-1528.
Valdmanis et al., Picosecond Electro-optic Sampling System, Appl. Phys. Lett., vol. 41, No. 3, Aug. 1, 1982, pp. 211-212.
Valdmanis et al., Subpicosecond Electrooptic Sampling: Principles and Applications, IEEE Journal of Quantum Electronics, vol. QE-33, No. 1, Jan. 1986, pp. 69-78.
Valdmanis et al., Electro-Optic Sampling: Testing Picosecond Electronics Part 1, Principles and Embodiments, Laser Focus/Electro-Optics, Feb. 1986, pp. 84, 86, 88, 90, 92, 94, 96.
Valdmanis et al., Electro-Optic Sampling: Testing Picosecond Electronics Part 2, Applications, Laser Focus/Electro-Optics, Mar. 1986, pp. 96-98, 100, 102, 104, 106.
Williamson et al., Picosecond Electro-Electron Optic Oscilloscope, Picosecond Electron, Optoelectron., 1985, pp. 58, 59, 61.
Valdmanis et al., Subpicosecond Electrical Sampling and Applications, Picosecond Optoelectronics Devices, Chapter 8, 1984, pp. 249-270.
Nees et al., Noncontact Electro-Optic Sampling with a GaAs Injection Laser, Electronics Letters, vol. 22, No. 17, Aug. 14, 1986, pp. 918-919.
Valdmanis et al., Subpicosecond Electrical Sampling, IEEE Journal of Quantum Electronics, vol. QE-19, No. 4, Apr. 1983, pp. 664-667.
Kolner et al., Electro-Optic Sampling with Picosecond Resolution, Electronics Letters, vol. 19, No. 15, Jul. 21, 1983, pp. 574-575.
Valdmanis, High-Speed Optical Electronics: The Picosecond Optical Oscilloscope, Solid State Technology, Test & Measurement World, Nov. 1986, pp. S40, S42, S44.
Kolner, Electrooptic Sampling in GaAs Integrated Circuits, IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 79-93.

Affiliated with

Also associated with

Rating

Voltage mapping device having fast time resolution does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Voltage mapping device having fast time resolution, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage mapping device having fast time resolution will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-49594