Voltage detector using electro-optic material and interference o

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Using radiant energy

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250227, 350356, 356345, G01R 3100, G01R 2912, G01B 902

Patent

active

048642207

ABSTRACT:
In a voltage detector using an electro-optic material whose refractive index is changed by a voltage developing in a selected area of an object under test, a light beam emitted from a light source is applied to a beam splitter, where it is split into a light beam advancing along a reference optical path and a light beam advancing along an optical path extended to an optical path length changing means made of the electro-optic material, and the light beams are returned from the reference optical path and the optical path length changing means after reflection to the beam splitter, where they are caused to interference with each other to provide an output light beam which is applied to a detector. The efficiency of light beam utilization is improved, and the voltage developing in the selected area of the object can be detected with high accuracy.

REFERENCES:
patent: 4446425 (1984-05-01), Valdmanis et al.
patent: 4533829 (1985-08-01), Miceli et al.
patent: 4603293 (1986-07-01), Mourou et al.
patent: 4618819 (1986-10-01), Mourou et al.
Valdmanis, J. A. et al., "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. qe-22, No. 1, pp. 69-78, Jan. 1986.
Valdmanis, J. A. et al., "Picosecond Electrooptic Sampling System", Appl. Phys. Lett., vol. 41, No. 3, pp. 211-212, Aug. 1982.
Valdmanis, J. A. et al., "Subpicosecond Electrical Sampling", IEEE Journal of Quantum Electronics, vol. qe-19, No. 4, pp. 664-667, Apr. 1983.
Kolner, B. H. et al., "Electro-Optic Sampling With Picosecond Resolution", Electronics Letters, vol. 19, No. 15, pp. 574-575, Jul. 1983.
Tsuchiya, Y., "Advances in Streak Camera Instrumentation for the Study of Biological and Physical Processes", IEEE Journal of Quantum Electronics, vol. qe-20, No. 12, pp. 1516-1528, Dec. 1984.
Valdmanis, J. A., "High-Speed Optical Electronics: The Picosecond Optical Oscilloscope", Solid State Technology/Test and Measurement World, pp. S40-S44, Nov. 1986.
Valdmanis, J. A. et al., "Electro-Optic Sampling: Testing Picosecond Electronics Part 1, Principles and Embodiments", Laser Focus/Electro-Optics, pp. 84-96, Feb. 1986.
Valdmanis, J. A. et al., "Electro-Optic Sampling: Testing Picosecond Electronics Part 2, Applications", Laser Focus/Electro-Optics, pp. 96-106, Mar. 1986.
Valdmanis, J. A. et al., "Subpicosecond Electrical Sampling and Applications", Picosecond Optoelectronic Devices, pp. 249-270, 1984.
Williamson, S. et al., "Picosecond Electro-Electron Optic Oscilloscope", Proc. Conf. Picosecond Electron, Optoelectron, pp. 58-61, (N.Y. Springer-Verlag), 1985.
Kolner, B. H. et al., "Electrooptic Sampling in GaAs Intergrated Circuits", IEEE Journal of Quantum Electronics, vol. qe-22, pp. 79-93, Jan. 1987.
Nees, J. et al., "Noncontact Electro-Optic Sampling With A GaAs Injection Laser", Electronics Letters, vol. 22, No. 17, pp. 918-919, Aug. 1986.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Voltage detector using electro-optic material and interference o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Voltage detector using electro-optic material and interference o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage detector using electro-optic material and interference o will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-245657

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.