Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Using radiant energy
Patent
1988-06-03
1989-12-12
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Using radiant energy
350413, G01R 1900, G01R 19155
Patent
active
048870269
ABSTRACT:
A voltage detector detects a voltage developing in a selected area of an object such as an integrated circuit by utilizing an electro-optic material equipped in an optical probe. A change in refractive index of the electro-optic material hwich is caused by the voltage in the object, is detected as a change of polarization of a light beam passing through the electro-optic material. In order to simplify the optical system, the electro-optic material itself has a function to change the light-traveling path. In the first aspect, a surface of light-incidence side is worked into a lens shape. In the second aspect, the electro-optic material has a graded refractive index profile as a result of ion diffusion.
REFERENCES:
patent: 4327963 (1982-05-01), Khoe et al.
patent: 4364639 (1982-12-01), Sinclair et al.
patent: 4446425 (1984-05-01), Valdmanis et al.
patent: 4603293 (1986-07-01), Mourou et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4762403 (1988-08-01), Hattori
Williamson, S. et al., "Picosecond Electro-Electron Optic Oscilloscope", Proc. Conf. Picosecond Electron. Optoelectron., pp. 58-61, (N.Y. Springer-Verlar), 1985.
Kolner, B. H. et al., "Electrooptic Sampling in GaAs Intergated Circuits", IEEE Journal of Quantum Electronics, vol. qe-22, pp. 79-93, Jan. 1987.
Nees, J. et al., "Noncontact Electro-Optic Sampling with a GaAs Injection Laser", Electronics Letters, vol. 22, No. 17, pp. 918-919, Aug. 1986.
Valdmanis, J. A. et al., "Electro-Optic Sampling: Testing Picosecond Electronics Part 1. Principles and Embodiments", Laser Focus/Electro-Optics, pp. 84-86, Feb. 1986.
Valdmanis, J. A. et al., "Electro-Optic Sampling: Testing Picosecond Electronics Part 2. Applications", Laser Focus/Electro-Optics, pp. 96-106, Mar. 1986.
Valdmanis, J. A. et al., "Subpicosecond Electrical Sampling and Applications", Picosecond Optoelectronic Devices, pp. 249-270, 1984.
Valdmanis, J. A. et al., "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. qe-22, No. 1, pp. 69-78, Jan. 1986.
Valdmanis, J. A. et al., "Picosecond Electrooptic Sampling System", Appl. Phys. Lett., vol. 41, No. 3, pp. 211-212, Aug. 1982.
Valdmanis, J. A. et al., "Subpicosecond Electrical Sampling", IEEE Journal of Quantum Electronics, vol. qe-19, No. 4, pp. 664-667, Apr. 1983.
Kolner, B. H., et al., "Electro-optic Sampling with Picosecond Resolution", Electronics Letters, vol. 19, No. 15, pp. 574-575, Jul. 1983.
Tsuchiya, Y., "Advances in Streak Camera Instrumentation for the Study of Biological and Physical Processes", IEEE Journal of Quantum Electronics, vol. qe-20, No. 12, pp. 1516-1528, Dec. 1984.
Valdmanis, J. A., "High-Speed Optical Electronics: The Picosecond Optical Oscilloscope", Solid State Technology/Test and Measurement World, pp. S40-S44, Nov. 1986.
Aoshima Shinichiro
Takahashi Hironori
Tsuchiya Yutaka
Burns W.
Eisenzopf Reinhard J.
Hamamatsu Photonics Kabushiki Kaisha
LandOfFree
Voltage detector for detecting a voltage developing in a selecte does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Voltage detector for detecting a voltage developing in a selecte, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage detector for detecting a voltage developing in a selecte will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2123631