Voltage detecting circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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Details

C324S133000, C324S433000

Reexamination Certificate

active

06859040

ABSTRACT:
There is provided a voltage detecting circuit in which a consumed electric current is small, accuracy is high, and an erroneous operation seldom occurs. In the voltage detecting circuit constituted by a bias circuit, a current mirror circuit, a load MIS transistor connected to the current mirror circuit in which current drive capability is changed by an output voltage of the bias circuit, and an amplifying inverter circuit, a potential change at an output node of the current mirror circuit at the time of detection and release of a power supply voltage is steeply changed, so that a leak current of the whole circuit can be decreased and a consumed electric current can be reduced. Besides, plural load P type MIS transistors of the bias circuit are prepared, so that a detection voltage and a release voltage can be made to have hysteresis, abnormal oscillation of a detection output VDETX in the vicinity of the detection and release voltage can be prevented, and an erroneous operation of a logic circuit to which the detection output is applied can be prevented.

REFERENCES:
patent: 4812680 (1989-03-01), Kawashima et al.
patent: 5159260 (1992-10-01), Yoh et al.
patent: 6351109 (2002-02-01), Yoshida
patent: 6404239 (2002-06-01), Kawahara et al.
patent: 6456090 (2002-09-01), Ishikawa et al.
patent: 6489786 (2002-12-01), Takemoto et al.
patent: 6566928 (2003-05-01), Miyagi
patent: 20010024064 (2001-09-01), Masaoka
patent: 20030094954 (2003-05-01), Mashiko
patent: 354015782 (1979-02-01), None

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