Voltage dependent parameter analysis

Details Voltage dependent parameter analysis Voltage dependent parameter analysis

2006-11-28

2006-11-28

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07142991

ABSTRACT:
A method of, and a system for, determining an extreme value of a voltage dependent parameter of an integrated circuit design is provided. The method includes determining a plurality of current waveforms, each of the plurality of waveforms corresponding to one of a plurality of aggressor objects in the design of the integrated circuit; applying each of the plurality of current waveforms to a subset of the plurality of power bus nodes, the subset of the plurality of power bus nodes being designed to supply power to a corresponding one of the plurality of aggressor objects; determining a plurality of voltage waveforms, each of the plurality of voltage waveforms being at one of the plurality of power bus nodes and corresponding to one of the plurality of current waveforms; using the plurality of voltage waveforms to determine the extreme value.

REFERENCES:
patent: 5555506 (1996-09-01), Petschauer et al.
patent: 5568395 (1996-10-01), Huang
patent: 6990420 (2006-01-01), Guo et al.
patent: 7039891 (2006-05-01), Tetelbaum
patent: 7062731 (2006-06-01), Tetelbaum
patent: 2004/0002844 (2004-01-01), Jess et al.
patent: 2005/0251354 (2005-11-01), Guo et al.
patent: 2005/0268260 (2005-12-01), Suaya et al.
patent: 2005/0268264 (2005-12-01), Nagai
patent: 2006/0100830 (2006-05-01), Lee et al.
Worst-Case Circuit Delay Taking Into Account Power Supply Variations; Dionysios Kouroussis, Rubil Ahmadi and Farid N. Najm; DAC 2004, Jun. 7-11, 2004, San Diego, CA; ACM 1-58113-838-8/04/0006; pp. 652-657.
Vectorless Analysis of Supply Noise Induced Delay Variation; Sanjay Pant, David Blaauw, Vladimir Zolotov, Savithri Sundareswaran, Rajendran Panda; ICCAD 2003, Nov. 11-13, 2003, San Jose, CA; ACM 1-58113-765-1/03/0011; pp. 184-191.
First-Order Incremental Block-Based Statistical Timing Analysis; C. Visweswariah, K. Ravindran, K. Kalafala, S.G. Walker and S. Narayan; DAC 2004, Jun. 7-11, 2004, San Diego, CA, ACM 1-58113-828-8/04/0006; pp. 331-336.

Affiliated with

Also associated with

Rating

Voltage dependent parameter analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Voltage dependent parameter analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Voltage dependent parameter analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3667902