Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2007-05-01
2007-05-01
Dickey, Thomas L. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S313000
Reexamination Certificate
active
10819123
ABSTRACT:
An N well is disposed in the upper surface of a P type substrate, a gate insulating film and a gate electrode are disposed thereon, and the gate electrode is connected to a gate terminal. Two p+diffusion regions are placed in two areas in the surface of the N well sandwiching the gate electrode, and the p+diffusion regions are connected to a ground potential wiring. Further, an n+diffusion region is disposed in the surface of the N well, and is connected to a well terminal. Accordingly, capacitance is generated between the gate electrode and the N well of a varactor element. When the potential of the gate terminal is decreased, the two p+diffusion regions absorb positive holes serving as minority carriers from a channel region.
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Fujimoto Yuki
Kurosawa Susumu
Nakashiba Yasutaka
Dickey Thomas L.
NEC Electronics Corporation
Sughrue & Mion, PLLC
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