Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-10-20
1996-05-07
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324677, 324713, 327 63, 327 65, G01R 2726, H03K 522
Patent
active
055149723
ABSTRACT:
A circuit compares a difference between first and second voltages to a predetermined voltage. The circuit comprises an amplifier having first and second inputs. First and second capacitors are each coupled at one end to the first input of the amplifier. The first capacitor is charged with the first voltage and subsequently discharged. The second capacitor is charged with a first reference voltage and subsequently discharged. Third and fourth capacitors are each coupled at one end to the second input of the amplifier. The third capacitor is charged with the second voltage and subsequently discharged. The fourth capacitor is charged with a second reference voltage and subsequently discharged.
REFERENCES:
patent: 4547683 (1985-10-01), Bingham
patent: 4707624 (1987-11-01), Yee
patent: 4803382 (1989-02-01), Tanimoto et al.
patent: 4803462 (1989-02-01), Hester et al.
patent: 4899068 (1990-02-01), Klose et al.
patent: 5113090 (1992-05-01), Imaizumi et al.
DeMoor Mark K.
Graf Paul W.
Hurd Jonathan J.
Do Diep
International Business Machines - Corporation
Samodovitz Arthur J.
Wieder Kenneth A.
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