Voltage clamp circuit and semiconductor device, overcurrent...

Details Voltage clamp circuit and semiconductor device, overcurrent... Voltage clamp circuit and semiconductor device, overcurrent...

2008-06-13

2010-06-08

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S072500

Reexamination Certificate

active

07733105

ABSTRACT:
In a voltage clamp circuit, a normally-on type field-effect transistor having a negative threshold voltage has a drain connected to an input node, a source connected to an output node and grounded via a resistance element, and a gate supplied with an output voltage of a variable direct-current power supply. When a voltage at the output node becomes higher than a clamping voltage because of voltage drop of the resistance element, the field-effect transistor is tuned off. Accordingly, the output voltage is limited to be at most the clamping voltage. Thus, a response speed is higher than those of conventional voltage clamp circuits using diodes or the like.

REFERENCES:
patent: 4314167 (1982-02-01), Groves et al.
patent: 4939450 (1990-07-01), Milberger et al.
patent: 6137278 (2000-10-01), Koffler et al.
patent: 7372291 (2008-05-01), Ng
patent: 7532445 (2009-05-01), Rana et al.
patent: 11-311644 (1999-11-01), None
patent: 2001-4670 (2001-01-01), None

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