Voltage blocking method and apparatus for a charge pump with...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage

Reexamination Certificate

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Reexamination Certificate

active

06373324

ABSTRACT:

FIELD OF THE INVENTION
The present invention pertains to the field of computer systems. More particularly, this invention pertains to the field of providing a charge pump for generating high voltages and high currents for erasing and programming flash electrically-erasable programmable read only memory arrays (flash EEPROMs).
BACKGROUND OF THE INVENTION
Flash EEPROMs play prominent and increasing roles in today's computer systems. Flash EEPROMs must be able to operate in computer systems where a supply voltage (Vcc) of 5V, 3V, or even smaller voltage is available to the EEPROM devices. However, performing program and erase operations within an EEPROM device requires that greater voltages than that supplied to the EEPROM be applied to the memory cells within the EEPROM. For example, a program operation might require that approximately 10.5V be applied to a memory cell. A voltage of approximately −10.5V might be required to perform an erase operation. These voltages are achieved within the EEPROM device by charge pump circuits. A positive charge pump can take a supplied Vcc voltage and create a voltage sufficient for programing operations. A negative charge pump can take a supplied ground voltage and create a negative voltage sufficient for erase operations. The negative and positive charge pumps must also be able to deliver sufficient current at the required voltage levels.
FIG. 1
shows a typical prior art positive charge pump
130
. The charge pump
130
includes a number of stages of N type field effect transistors
131
,
132
,
133
, and
134
connected in series between a source voltage Vcc and an output terminal Vout. Clock signals
1
and
3
are supplied to the circuit
130
from sources
1
and
3
, respectively, via capacitors
136
,
137
, and
138
. Clock signals
2
and
4
are supplied to the circuit
130
from sources
2
and
4
, respectively, via capacitors
140
,
141
, and
142
. Each stage of the circuit
130
includes an N channel field effect transistor device
143
,
144
, or
145
used to control the voltage at the gate terminal of the device
131
,
132
, or
133
of that stage.
FIG. 2
shows the clock signals referred to as clock
1
, clock
2
, clock
3
, and clock
4
associated with the circuit
130
. In order to understand the operation of the circuit
130
, the operation of a single stage including the switching transistor
132
will be discussed. Following the prior art timing diagram of
FIG. 2
, clocks
3
and
4
are initially high. Because clock
3
is high, the control device
144
is initially on. When the clock
1
signal goes high, the voltage pulse applied through the capacitor
136
charges the capacitor
141
at the gate terminal of the device
132
through the device
144
to the voltage level of the gate terminal of the device
144
minus a threshold voltage drop. When the clock
3
then goes low, the device
144
turns off, isolating the gate of the device
132
and leaving the capacitor
141
charged. This also lowers the voltage at the source of the device
132
so that the device
132
begins to conduct. When the clock
2
then goes high, the voltage at the gate is appreciably higher than at the drain because of the precharging of the capacitor
141
. This turns the device
132
on in the region where it experiences no threshold voltage drop. The elimination of the threshold voltage drop means that the circuit can provide increased current from the capacitor
136
to the next stage. The high voltage at the capacitor
136
begins to charge the capacitor
137
and to discharge the capacitor
142
through the device
145
.
When the clock
2
then goes low, the device
132
begins to turn off. When the clock
3
goes high, the device
144
turns on discharging the gate of the device
132
and bringing it toward the voltage of the drain so that the device
132
turns off. When the clock
1
then goes low, the device
132
stays off and the device
144
stays on so that the charge at the drain and gate are equalized.
Viewing the circuit as a whole, when the device
131
comes on in response to the high clock
4
, its gate has been charged through the device
143
which has gone off. Thus, the device
131
turns on without a threshold voltage drop and charges the capacitor
136
rapidly. Then the device
131
begins to turn off as the clock
4
goes low. The rising clock
1
pulse completes the turnoff of the device
131
by discharging the capacitor
140
through the device
143
. The high clock
1
continues the charging of the capacitor
141
until the drop of the clock
3
turns off the device
144
leaving the gate of the device
132
charged. The lowering of the clock
3
begins turning on the device
132
which comes on completely without a threshold voltage drop when the clock
2
goes high and the gate of the device
132
goes above the drain. This allows the charging of the capacitor
137
. The same sequence continues through whatever number of stages are present until the charge on the capacitor
138
is sufficient to turn on the device
134
to provide a pumped voltage level at the output of the circuit
130
. It should be noted that the last stage operates in a range in which it experiences a threshold voltage drop.
In addition to experiencing a threshold voltage drop in the last stage, prior pump circuits such as that discussed above have the disadvantage of being unable to provide adequate current when required to operate with supply voltages below approximately 3 V. For example, the pump circuit
130
discussed above would be unable to produce adequate current when supplied with 1.8 V and pumping up to a voltage of 10.5 V. An analogous situation exists with prior negative charge pumps, where a negative pump may need to pump to a voltage of approximately −12.5 V when a supply voltage of 1.8 V is supplied to a flash EEPROM.


REFERENCES:
patent: 5140182 (1992-08-01), Ichimura
patent: 5301097 (1994-04-01), McDaniel
patent: 5414669 (1995-05-01), Tedrow et al.
patent: 5422586 (1995-06-01), Tedrow et al.
patent: 5422590 (1995-06-01), Coffman et al.
patent: 5426391 (1995-06-01), Tedrow
patent: 5430402 (1995-07-01), Tedrow et al.
patent: 5446408 (1995-08-01), Tedrow et al.
patent: 5483486 (1996-01-01), Javanifard et al.
patent: 5589793 (1996-12-01), Kassapian
patent: 5650671 (1997-07-01), Pascucci et al.
patent: 5734290 (1998-03-01), Chang et al.
patent: 5821805 (1998-10-01), Jinbo
patent: 5841703 (1998-11-01), Wojciechowski
patent: 5973546 (1999-10-01), Le et al.
patent: 5982224 (1999-11-01), Chung et al.
patent: 6023188 (2000-02-01), Lee et al.
patent: 6151229 (2000-11-01), Taub et al.
patent: 6292048 (2001-09-01), Li

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