VLSI tester backplane

Details VLSI tester backplane VLSI tester backplane

1989-06-09

1991-03-19

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3102

Patent

active

050014226

ABSTRACT:
An improved design verification system for testing VLSI chips including an outer chassis with access hatches for servicing, removing and installing test circuitry. The chassis additionally incorporates an optics aperture and a manipulator interface which are used in conjunction with other test equipment such as wafer probers. A device-under-test (DUT) board for electromechanically positioning an integrated circuit device is electrically connected directly to a plurality of pin electronics (PE) boards through extended DUT board edge connectors. In addition to the direct DUT/PE boards connection, the PE boards are also directly connected to the backplane assembly through data edge connectors and power edge connectors. The backplane assembly is provided with a backplane board encircled by power boards having receptacles to couple with the data edge connectors and the power edge connectors of the PE boards, and slots through which the extended DUT board edge connectors of the PE boards can project in order to form an electrical connection with the DUT board.

REFERENCES:
patent: 4705447 (1987-11-01), Smith
patent: 4758780 (1988-07-01), Coon et al.
patent: 4862075 (1989-08-01), Choi et al.

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