VLSI component tester with average current measuring capability

Details VLSI component tester with average current measuring capability VLSI component tester with average current measuring capability

1994-10-06

1996-06-18

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

364487, 327141, 327334, 326 16, G01R 2316, G01R 3128, H03L 100, H03K 400

Patent

active

055281362

ABSTRACT:
Automatic test equipment including a circuit to measure average current consumed by a device under test. The circuit operates during the execution of a test pattern which is not dedicated to measuring average current. The average current measuring circuit sets the measurement interval to account for a lag between the current drawn by the device under test and the current being measured.

REFERENCES:
patent: 4641246 (1987-02-01), Halbert et al.
patent: 4694242 (1987-09-01), Peterson et al.
patent: 4806852 (1989-02-01), Swan et al.
patent: 5115447 (1992-05-01), Bowman
patent: 5381045 (1995-01-01), Kojima

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