Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-09-27
2005-09-27
Chang, Jon (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C348S126000, C700S110000
Reexamination Certificate
active
06950549
ABSTRACT:
In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed circumscribing rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at high accuracy irrespectively of a low cost.
REFERENCES:
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patent: 6167149 (2000-12-01), Tsujikawa et al.
patent: 8-203972 (1996-08-01), None
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patent: 2000-121338 (2000-04-01), None
Nagao Masahiko
Sasaki Yoshihiro
Chang Jon
Kim Charles
NEC Electronics Corporation
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