Visual inspection device and process

Details Visual inspection device and process Visual inspection device and process

1991-11-15

1993-11-09

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358101, H04N 718

Patent

active

052607801

ABSTRACT:
A vision inspection system capable of high resolution of distanced portions of the same part is provided, allowing for dimensional calculations to be made on large parts with high resolution. A process for inspection of a part is provided, comprising the steps of: mapping a first portion of the part; mapping a second portion of the part; defining a first reference coordinate corresponding to a first reference point located on the first portion of the part; defining a second reference coordinate corresponding to a second reference point located on the second portion of the part; determining the number of coordinates between the first reference coordinate and the second reference coordinate; calculating a constant corresponding to a third portion of the part, wherein the third portion of the part is not mapped; and adding the constant to the number of coordinates between the first and the second reference coordinates.

REFERENCES:
patent: 4135817 (1979-01-01), Young
patent: 4520389 (1985-05-01), Hornschuh
patent: 4581762 (1986-04-01), Lapidus
patent: 4644394 (1987-02-01), Reeves
patent: 4727179 (1988-02-01), Schmalfuss

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