Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2008-05-15
2010-06-15
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237100
Reexamination Certificate
active
07738091
ABSTRACT:
A visual inspection apparatus includes: a first substrate holding portion that holds a substrate so that a top surface is observable; a second substrate holding portion that holds the substrate so that a bottom surface is observable; a first substrate holding portion moving mechanism that moves the first substrate holding portion; a second substrate holding portion moving mechanism that moves the second substrate holding portion; and a control device that controls the first substrate holding portion moving mechanism and the second substrate holding portion moving mechanism so that the position of the substrate when observing the top surface of the substrate in the first substrate holding portion substantially matches the position of the substrate when observing the bottom surface of the substrate in the second substrate holding portion.
REFERENCES:
patent: 6606154 (2003-08-01), Oda
patent: 2006/0215152 (2006-09-01), Hashimoto
patent: 10-092887 (1998-04-01), None
patent: 2006-170622 (2006-06-01), None
Frishauf Holtz Goodman & Chick P.C.
Olympus Corporation
Toatley Jr. Gregory J
Ton Tri T
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