Vision inspection system device and method

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections

Reexamination Certificate

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Details

C356S237100, C356S237200

Reexamination Certificate

active

07978328

ABSTRACT:
A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.

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patent: 2004/0095586 (2004-05-01), Stylios
patent: 2005/0203657 (2005-09-01), Engelbart et al.
patent: 2007/0097359 (2007-05-01), Engelbart et al.
patent: 07071931 (1995-03-01), None
patent: 07229708 (1995-08-01), None
patent: 09321498 (1997-12-01), None
patent: 2003337012 (2003-11-01), None

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