Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-02-27
1997-10-21
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 73, 356237, G01B 1130
Patent
active
056802153
ABSTRACT:
An optical vision inspection system (4) and method for multiplexed illuminating, viewing, analyzing and recording a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface (7) with first and second alternating optical subsystems (20, 21) illuminating and sensing successive frames of the same material surface patch. To detect the different kinds of surface features including abrupt as well as gradual surface variations, correspondingly different kinds of lighting are applied in time-multiplexed fashion to the common surface area patches under observation.
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Huber Edward D.
Williams Rick A.
Lockheed Missiles & Space Company Inc.
Pham Hoa Q.
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