Vision aided docking mechanism for semiconductor testers

Details Vision aided docking mechanism for semiconductor testers Vision aided docking mechanism for semiconductor testers

1997-08-01

2000-03-14

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 3241581, G01R 106

Patent

active

060377917

ABSTRACT:
An integrated circuit tester for a test board which has a visual target. The tester includes a test arm that can be electrically coupled to the test board and a movement mechanism that can move the arm relative to the board. The tester further includes a camera that is mounted to the test arm. The camera provides a visual image of the visual target which is used to align the test arm with the test board.

REFERENCES:
patent: 4820975 (1989-04-01), Diggle
patent: 5045710 (1991-09-01), Linker, Sr. et al.
patent: 5479109 (1995-12-01), Lau et al.
patent: 5804983 (1998-09-01), Nakajima et al.

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