Virtual test head for IC

Details Virtual test head for IC Virtual test head for IC

2004-09-23

2008-10-14

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07436197

ABSTRACT:
In a test system for a semiconductor device, the device under test (DUT) is remotely located relative to the tester that generates the test vector signals. The tester and remotely located DUT are connected by a serial connection and each includes a serializer-deserializer for converting outgoing data to serial form and deserializing incoming data.

REFERENCES:
patent: 4504783 (1985-03-01), Zasio et al.
patent: 5126657 (1992-06-01), Nelson
patent: 6275962 (2001-08-01), Fuller et al.
patent: 6393591 (2002-05-01), Jenkins et al.
patent: 6563298 (2003-05-01), Creek et al.
patent: 7007212 (2006-02-01), Komatsu et al.
patent: 7058535 (2006-06-01), Chenoweth et al.
patent: 7242209 (2007-07-01), Roberts et al.
patent: 2003/0101395 (2003-05-01), Man et al.
patent: 2003/0105607 (2003-06-01), Jones et al.
patent: 2003/0196139 (2003-10-01), Evans
patent: 2004/0059970 (2004-03-01), Wieberdink et al.
patent: 2005/0034019 (2005-02-01), Mayer et al.
patent: 2005/0066231 (2005-03-01), Szucs et al.
patent: 2005/0174131 (2005-08-01), Miller
patent: 2005/0253617 (2005-11-01), Roberts et al.

Affiliated with

Also associated with

Rating

Virtual test head for IC does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Virtual test head for IC, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Virtual test head for IC will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4004615