Virtual test environment

Details Virtual test environment Virtual test environment

2008-01-29

2008-01-29

Thangavelu, K (Department: 2123)

Data processing: structural design, modeling, simulation, and em

Simulating electronic device or electrical system

Circuit simulation

C703S019000, C703S013000, C703S015000, C716S030000, C714S726000, C714S731000, C714S815000

Reexamination Certificate

active

11169597

ABSTRACT:
A method of and an apparatus for designing a test environment providing reliable test signal integrity, and of evaluating performance of the test environment and an electronic device during testing of the electronic device. A virtual test environment is created emulating an actual test environment in which the electronic device is to be tested. A virtual calibration of the virtual test environment may be performed, to more closely emulate the actual test environment. A virtual device emulating the actual electronic device is implanted into the virtual test environment, and that virtual device is stimulated with an input test signal emulating the actual input signal that is applied to the actual electronic device in the actual test environment. The integrity of the input test signal and the resulting output signal is evaluated. Based on that evaluation an adjustment might be made to the virtual calibration of the virtual test environment and/or to the virtual device, or both, and the design of the actual device might be improved. The invention can be implemented on a properly programmed general purpose processing system or on a special purpose system.

REFERENCES:
patent: 5872952 (1999-02-01), Tuan et al.
patent: 5931962 (1999-08-01), Dang
patent: 6197605 (2001-03-01), Simunic et al.
patent: 6370675 (2002-04-01), Matsumura et al.
patent: 6470482 (2002-10-01), Rostoker et al.
patent: 6550036 (2003-04-01), Panis
patent: 6678643 (2004-01-01), Turnquist et al.
patent: 6704895 (2004-03-01), Swoboda et al.
patent: 2002/0049554 (2002-04-01), Miller

Affiliated with

Also associated with

Rating

Virtual test environment does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Virtual test environment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Virtual test environment will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3927200