Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-08-01
2010-02-09
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S106000, C702S121000, C324S072500, C324S754090, C324S1540PB, C455S296000, C375S346000
Reexamination Certificate
active
07660685
ABSTRACT:
A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.
REFERENCES:
patent: 5579299 (1996-11-01), Halter et al.
patent: 5691635 (1997-11-01), Pot et al.
patent: 6351112 (2002-02-01), Felps et al.
patent: 6701335 (2004-03-01), Pupalaikis
patent: 6725170 (2004-04-01), Hickman
patent: 6856126 (2005-02-01), McTigue et al.
patent: 6870359 (2005-03-01), Sekel
patent: 7180314 (2007-02-01), Sekel
patent: 7233967 (2007-06-01), Sureka
patent: 7405575 (2008-07-01), Tan et al.
patent: 7408363 (2008-08-01), Tan et al.
patent: 7414411 (2008-08-01), Tan et al.
patent: 7460983 (2008-12-01), Pickerd et al.
patent: 2004/0223349 (2004-11-01), Nash
patent: 2005/0185768 (2005-08-01), Pickerd et al.
patent: 2005/0185769 (2005-08-01), Pickerd et al.
patent: 2005/0265725 (2005-12-01), Okano et al.
patent: 2006/0098987 (2006-05-01), Hoshida
patent: 2008/0048673 (2008-02-01), Tan et al.
patent: 2008/0048677 (2008-02-01), Tan et al.
patent: 2008/0052028 (2008-02-01), Pickerd et al.
Bockelman, D.E. et al., “Combined Differential and Common-mode Scattering Parameters: Theory and Simulation”,IEEE Trans. Microwave Theory Tech., vol. 43, (Jul. 1995),1530-1539.
Kurokawa, K “Power Waves and the Scattering Matrix”,IEEE Trans. Microwave Theory Tech., vol. MTT-13, (Mar. 1965),194-202.
“S-Parameter Design”,Agilent Application Note 154(5852-1087), (Mar. 1990),1-44.
Smolyansky, D.A. et al., “Characterization of differential interconnects from time domain reflectometry measurements”,TDA Systems Inc. Published in Microwave Journal. vol. 43, No. 3, (2000),1-6.
McGowan, R et al., “A direct relation between signal time series and its unwrapped phase”,IEEE Trans. Acoust., Speech, Signal Processing, vol. ASSP-30, (1982),719-726.
Long, D.G. “Exact computation of the unwrapped phase of a finite-length time series”,IEEE Trans. Acoust., Speech, Signal Processing, vol. 36, No. 11, (Nov. 1988),1787-1790.
“Three and four port s-parameters: calibrations and mixed mode parameters”,Anritsu Application Note, 11410-00279, (Nov. 2001),1-16.
“WaveLink probe system”,LeCroy Corporation, (Sep. 2005),1-8.
“Restoring Confidence in Your High-Bandwidth Probe Measurements”,Agilent Application Note 1419-01, (Nov. 2002),1-6.
“Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes”,Agilent Application Note 1419-02, (Nov. 2002),1-12.
“Performance Comparison of Differential and Single-Ended Active Voltage Probes”,Agilent Application Note 1419-03, (Nov. 2002),1-12.
“Network Communication Physical Layer Testing with a CSA7000 Series Communications Signal Analyzer”,Tektronix Application Note 55W-15028-0, (2001),1-12.
“S-Parameter Techniques for Faster, More Accurate Network Design”,Hewlett Packard Test&Measurement Application Note 95-1, (1996),1-79.
Fan, W et al., “Mixed-Mode S-Parameter Characterization of Differential Structures”,IEEE 2003 Electronics Packaging Technology Conference, (2003),533-537.
Jacobs Lawrence W.
Pupalaikis Peter J.
Sekel Stephen M.
Kessler Gordon
LeCroy Corporation
Tsai Carol S
LandOfFree
Virtual probing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Virtual probing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Virtual probing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4175115