Virtual ground circuit for reducing SRAM standby power

Static information storage and retrieval – Addressing – Plural blocks or banks

Reexamination Certificate

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C365S226000

Reexamination Certificate

active

07379374

ABSTRACT:
A method of operating a memory circuit having a plurality of blocks of memory cells (400-404) is disclosed. The method includes storing data in the plurality of blocks of memory cells. A first block of memory cells (400) is selected in response to a first address signal (RAY0). A row of memory cells (430-436) in the first block of memory cells is selected in response to a second address signal (RAX0). A first voltage is applied to a first power supply terminal (412) of the first block of memory cells in response to the first address signal. A second voltage different from the first voltage is applied to a first power supply terminal (412) of another block of memory cells (402) of the plurality of blocks of memory cells. Data is retained in the other block of memory cells.

REFERENCES:
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patent: 5644576 (1997-07-01), Bauchot et al.
patent: 5689470 (1997-11-01), Inoue
Wei et al., “Design and Optimization of Low Voltage High Performance Dual Threshold CMOS Circuits,” 35thDesign Automation Conference Proc., 489-494 (1998).
Powell et al., “Gated-Vdd: A Circuit Technique to Reduce Leakage in Deep-Submicron Cache Memories,” Proc. Int. Symp. Low Power Electronics and Design (ISLPED), 90-95 (2000).
Agarawal et al., “A Single-Vt Low-Leakage Gated-Ground Cache for Deep Submicron,” IEEE J. Solid-State Circuits, vol. 38, No. 2, 319-328 (Feb. 2003).

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