Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2004-03-05
2010-12-14
Le, Brian Q (Department: 2624)
Image analysis
Pattern recognition
Template matching
C382S107000, C382S154000
Reexamination Certificate
active
07853085
ABSTRACT:
A method and system for detecting a source multifeatured three-dimensional object from two-dimensional source imagery, and for locating a best-matching three-dimensional object from a candidate database of such objects by performing a viewpoint and lighting invariant search among the candidate objects. The invention further includes the method and system for determining the optimally-fitting viewpoint, lighting, and deformation of the located three-dimensional candidate and basing an identification of the candidate with the source on the quality of fit between projections of the candidate and the source imagery.
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Animetrics, Inc.
Le Brian Q
Tsai Tsung-Yun
Wilmer Cutler Pickering Hale & Dorr LLP.
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