Video contour measurement system employing moire interferometry

Details Video contour measurement system employing moire interferometry Video contour measurement system employing moire interferometry

1993-12-21

1995-07-25

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Interference pattern analysis

356374, G02B 2742

Patent

active

054364620

ABSTRACT:
An electroptic metrology system uses Moire interferometry to generate contour information on the surface of an object. Interfering coherent beams generate a n image on the object's surface that includes a stripe pattern. The surface is viewed with a high resolution camera and digitized using a frame grabber and computer. A reference pattern is generated in software and is mixed with the digitized object surface signals. The mixed signals are filtered to remove signals at the carrier frequency and signals containing the beat frequency indicative of the surface contours are output.

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