Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-12-20
2005-12-20
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S691000, C280S735000
Reexamination Certificate
active
06977510
ABSTRACT:
A circuit and a related method to measure very precisely the resistance Rm of a small resistor independent from process and temperature variations. This resistor may be the RON resistance of an external sensor or e.g. the resistance of a safety device as a squib. A constant current source provides a current IBIAS causing a voltage drop Vm at the resistor to be measured. Using a configuration of operational amplifiers and current mirrors, wherein one of the current mirrors has a gain of n, an output voltage VOUT is achieved, which is defined by VOUT=n×Rm×IBIAS. The gain n of a current mirror allows a very precise measurement of the resistance Rm of the resistor to be measured. The output voltage is finally converted from analog to digital values.
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patent: 6133749 (2000-10-01), Hansen et al.
patent: 6498494 (2002-12-01), Belau et al.
patent: 0454012 (1991-10-01), None
patent: 0701928 (1996-03-01), None
Ackerman Stephen B.
Dialog Semiconductor GmbH
Nguyen Vincent Q.
Saile George O.
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