Very low pressure chemical vapor deposition process for depositi

Coating processes – Electrical product produced – Welding electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

427255, 4272552, 437200, 437225, B05D 306, C23C 1642

Patent

active

049577778

ABSTRACT:
The selective or blanket deposition of titanium silicide using a Very Low Pressure Chemical Vapor Deposition process is described. Silane and titanium tetrachloride are used as the silicon and titanium sources, respectively. A thin polysilicon layer is deposited prior to the silicide deposition to promote the nucleation of titanium silicide. It is shown that selective deposition is possible by controlling the polysilicon and the titanium silicide deposition times. The resulting titanium silicide films have resistivities in the range of 15-25 micro-ohms-cm.

REFERENCES:
patent: 3801365 (1974-04-01), Hrzek
patent: 4359490 (1982-11-01), Lehrer
patent: 4362597 (1982-12-01), Fraser et al.
patent: 4501769 (1985-02-01), Hieber et al.
patent: 4504521 (1985-03-01), Widmer et al.
patent: 4557943 (1985-12-01), Rosler et al.
patent: 4568565 (1986-02-01), Gupta et al.
patent: 4619038 (1986-10-01), Pintchovski
patent: 4635347 (1987-01-01), Lien et al.
patent: 4657628 (1987-04-01), Holloway et al.
patent: 4668530 (1987-05-01), Reif et al.
patent: 4690730 (1987-01-01), Tang et al.
C. M. Osburn et al., "High Conductivity Diffusions and Gate Regions Using Self-Aligned Silicide Technology," Dell'Oca & Bullis (ed), Electrochem. Soc., Pennington, N.J., 82-7:213-223, (1982).
C. Y. Ting et al., "The Use of TiSi.sub.2 in a Self-Aligned Silicide Technology," Dell'Oca and Bullis (ed), Electrochem. Soc., Pennington, N.J., 82-7:224-231, (1982).
Rosler and Engle, "Plasma-Enhanced CVD of Titanium Silicide," J. Vac. Sci. Technol., 8(2(4)):733-737, (1984).
M. J. H. Kemper et al., "CVD and Plasma Enhanced CVD of TiSi.sub.2," Extended Abstracts, Electrochem. Soc. Fall Mtg. (New Orleans), 84-2:533-534, (1984).
P. K. Tedrow et al., "Low Pressure Chemical Vapor Deposition of Titanium Silicide," Appl. Phys. Lett., 46(2):189-191, (1985).
A. Bouteville et al., "LPCVD of Titanium Disilicide," J. Electrochem. Soc., 134(8):2080-2083, (1987).
S. Ahmad et al., "A Simple Method of Depositing Oxygen-Free Titanium Silicide Films Using Vacuum Evaporation," Thin Solid Films, 143:155-162, (1986).
S. L. Zhang et al., "Selective LPCVD-W Deposition on Silicides," Vide, Couches Minces, 42:195-197, (1987).
S. S. Chen et al., "Properties of TiSi.sub.2 as an Encroachment Barrier for the Growth of Selective Tungsten on Silicon," J. Vac. Sci. Technol., B5(6):1730-1735, (1987).
E. K. Broadbent et al., "Characterization of Titanium Silicide Films Formed by Composite Sputtering and Rapid Thermal Annealing," Thin Solid Films, 151:51-63, (1987).
W. Kern and G. L. Schnable, "Low-Press Chemical Vapor Deposition for Very Large-Scale Integration Processing--A Review," IEEE Trans. Electron Devices, 26(4):647-657, (1979).
S. P. Murarka et al., "Refractory Silicides of Titanium and Tantalum for Low-Resistivity Gates and Interconnects," IEEE J. Solid-State Circuits, SC-15(4):474-482, (1980).
M. E. Alperin et al., "Development of the Self-Aligned Titanium Silicide Process for VLSI Applications," IEEE J. Solid-State Circuits, SC-20(1):61-69, (1985).
G. A. West et al., "Laser-Induced Chemical Vapor Deposition of Titanium Silicide Films," J. Vac. Sci. Technol., A3(6):2278-2282, (1985).
S. P. Murarka, "Refractory Silicides for Integrated Circuits," J. Vac. Sci. Technol., 17(4):775-792, (1980).
S. Lyer and C. Y. Ting, "New Salicide Spacer Technology," IBM Tech. Discl. Bulletin, 27(3):1801-1802, (1984).
P. K. Tedrow et al., "Titanium Silicide Films Deposited by Low Pressure Chemical Vapor Deposition," Mat. Res. Soc. Symp. Proc., 37:619-622, (1985).
V. Ilderem et al., "Properties of Titanium Silicide Films Deposited by an LPCVD," Tenth Int'l CVD Conf. Extended Abstract, Fall Meeting Electrochem. Soc., 87-2, Abstract No. 1058, p. 1467, (1987).
"Novel Selective Poly- and Epitaxial-Silicon Growth (SPEG) Technique for ULSI Processing", Mieno et al., IEDM 87, pp. 16-19.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Very low pressure chemical vapor deposition process for depositi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Very low pressure chemical vapor deposition process for depositi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Very low pressure chemical vapor deposition process for depositi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1571871

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.